EC-Tec

Electrochemical Technology

EC-Tec provides sophisticated equipment for in-situ studies at solid / liquid interfaces with in-situ Scanning Probe Microscopy (SPM) or in-situ Scanning Electrochemical Microscopy (SECM).
Our sophisticated bipotentiostats are the basis for the in-situ combination of Scanning Probe Microscopy (SPM) or Scanning Electrochemical Microscopy (SECM) with any other measurement technique, as for example potential and current transient studies at solid / liquid interfaces utilizing professional waveform generators and oscilloscopes, advanced Distance Tunneling Spectroscopy (DTS) or Voltage Tunneling Spectroscopy (VTS), impedance spectroscopy at solid / liquid interfaces (EIS) utilizing professional frequency analyzers, or magneto-optical (MOKE) measurements. SPM and SECM are performed under real bipotentiostatic control, which means that both tip and substrate are electrochemical electrodes in contrast to other commercial instruments.
Our flexible concept allows to tailor the experimental setup to any requirement in research at any time, and allows to carry out research at solid / liquid interfaces with unprecedented accuracy, and without apparative compromises.